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Selection Line Optimization of Nanoelectromechanical (NEM) Memory Switches for Stress Relief
Influence of Etch Profiles on the Leakage Current and Capacitance of 3-D DRAM Storage Capacitors
Proton-irradiation Effects on Charge Trapping-related Instability of Normally-off AlGaN/GaN Recessed MISHFETs
A 12-Gb/s Continuous-time Linear Equalizer with Offset Canceller
A CMOS Fourth-order Delta-sigma Modulator with a Single Reconfigurable Fully Differential Amplifier
Fabrication of Tandem-type Vertically Integrated Nanogenerator by In-situ Deposition of AlN/ZnO Films