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The Journal of Semiconductor Technology and Science (JSTS) is an international, peer-reviewed, and open-access journal that is published bimonthly.
- Scope: semiconductor processes, devices, circuits, and MEMS.
- Editor-in-Chief: Prof. Woo Young Choi (ECE, Seoul National University)
- Indexed within Science Citation Index Expanded (SCIE), SCOPUS, Korea Citation Index (KCI), and other databases.

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2019-12

P.1

[Cover] Journal of Semiconductor Technology and Science(JSTS), Vol. 19, No. 6, December, 2019

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P.511

[REGULAR PAPER] A Reconfigurable CMOS Power Amplifier Using Adaptive Biasing Technique for Wireless Monitoring Applications

Chung-Ching Lin;Nahid Mirzaie;Ahmed Alzahmi;Gyung-Su Byun
https://doi.org/10.5573/JSTS.2019.19.6.511
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P.517

[REGULAR PAPER] A 2 GS/s, 6-bit DAC for UWB Applications In 0.18 ?m CMOS Technology

Yi Zhang;Zhonghua Liu;Changchun Zhang;Yufeng Guo;Ying Zhang;Xiaopeng Li;Youtao Zhang;Hao Gao
https://doi.org/10.5573/JSTS.2019.19.6.517
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P.527

[REGULAR PAPER] Proactive Row Buffer Management for LPDDR2-NVM Devices

Jaehyun Park;Donghwa Shin;Hyung Gyu Lee
https://doi.org/10.5573/JSTS.2019.19.6.527
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P.540

[REGULAR PAPER] Study of Gate Leakage Current on AlGaN/GaN MOS-HEMTs with Atomic Layer Deposited Al2O3 Gate Oxide

Konepachith Ouduangvilai;Hoon-Ki Lee;Vallivedu Janardhanam;P. R. Shekar Reddy;Chel-Jong Choi;Kyu-Hwan Shim
https://doi.org/10.5573/JSTS.2019.19.6.540
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P.551

[REGULAR PAPER] A More Accurate Analytical DC Compact Modeling of Tunneling Field-Effect Transistor for SPICE Simulation

Seoyeon Go;Won Jae Lee;Seongjae Cho
https://doi.org/10.5573/JSTS.2019.19.6.551
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P.561

[REGULAR PAPER] An Ultrasonic Echo-signal Based Digital Background Calibration for Pipelined SAR ADC

Nam-Kyu Kim;Ji-Yong Um
https://doi.org/10.5573/JSTS.2019.19.6.561
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P.571

[REGULAR PAPER] Analysis and Modeling of Program Disturbance by Hot Carrier Injection in 3D NAND Flash Memory Using TCAD

Yongmin Lee;Sungbak Kim;Hyungcheol Shin
https://doi.org/10.5573/JSTS.2019.19.6.571
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P.577

[REGULAR PAPER] Practical Silicon-backside-protection Method for Abnormally Detection

Kyungsuk Yi;Minsu Park;Sungyong Cha;Seung-Joo Kim
https://doi.org/10.5573/JSTS.2019.19.6.577
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P.585

[REGULAR PAPER] A 10-bit, 50-MS/s Cyclic and SAR Combined Two-stage ADC with Gain Error Calibration

Cheonwi Park;Byung-geun Lee
https://doi.org/10.5573/JSTS.2019.19.6.585
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