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Journal Archive

2021-12

P.373

Sensitivity-controllable P-N Diode Temperature Sensor with High-sensitivity

(Chun-Hyung Cho) ; (Hyuntai Kim)
https://doi.org/10.5573/JSTS.2021.21.6.373
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P.381

Effect of Work-function Variation on Transfer Characteristics and Memory Performances for Gate-all-around JLFET based Capacitorless DRAM

(Sang Ho Lee) ; (Young Jun Yoon) ; (Jae Hwa Seo) ; (Min Su Cho) ; (Jin Park) ; (Hee Dae An) ; (So Ra Min) ; (Geon Uk Kim) ; (In Man Kang)
https://doi.org/10.5573/JSTS.2021.21.6.381
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P.390

Design and Analysis of DC/DC Boost Converter using Vertical GaN Power Device based on Epitaxially Grown GaN-on-sapphire

(Min Su Cho) ; (Sang Ho Lee) ; (Hee Dae An) ; (Jin Park) ; (So Ra Min) ; (Geon Uk Kim) ; (Young Jun Yoon) ; (Jae Hwa Seo) ; (In Man Kang)
https://doi.org/10.5573/JSTS.2021.21.6.390
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P.398

Electrical Performances of GaN-based Vertical Trench MOSFETs with Cylindrical and Hexagonal Structure

(Geon Uk Kim) ; (Young Jun Yoon) ; (Jae Hwa Seo) ; (Min Su Cho) ; (Sang Ho Lee) ; (Jin Park) ; (Hee Dae An) ; (So Ra Min) ; (In Man Kang)
https://doi.org/10.5573/JSTS.2021.21.6.398
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P.406

Predominance of Carrier Diffusion in Determination of Data Retention in One-transistor Dynamic Random-access Memory

(Yi Ju Lee) ; (Seongjae Cho)
https://doi.org/10.5573/JSTS.2021.21.6.406
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P.412

Operation of NO2 Gas Sensors based on Pd-AlGaN/GaN HEMT up to 500 °C

(Van Cuong Nguyen) ; (Ho-Young Cha) ; (Hyungtak Kim)
https://doi.org/10.5573/JSTS.2021.21.6.412
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P.418

A New Coupling Spring Design for MEMS Tuning Fork Structures Demonstrating Robustness to Fabrication Errors and Linear Accelerations

(Faisal Iqbal) ; (Hussamud Din) ; (Seung-Oh Han) ; (Byeungleul Lee)
https://doi.org/10.5573/JSTS.2021.21.6.418
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P.427

A Secure Scan Design based on Scan Scrambling by Pseudorandom Values and Circuit Itself

(Weizheng Wang) ; (Yan Peng) ; (Zuoting Ning) ; (Peng Liu) ; (Shuo Cai)
https://doi.org/10.5573/JSTS.2021.21.6.427
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P.438

A 32.2 GHz Full Adder Designed with TLE Method in a InP DHBT Technology

(Yi Zhang) ; (Xiaopeng Li) ; (Youtao Zhang) ; (Yufeng Guo) ; (Ying Zhang) ; (Hao Gao)
https://doi.org/10.5573/JSTS.2021.21.6.438
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P.449

A 70 dB SNDR 10 MS/s 28 nm CMOS Nyquist SAR ADC with Capacitor Mismatch Calibration Reusing Segmented Reference Voltages

(Ho-Jin Kim) ; (Jun-Ho Boo) ; (Jae-Hyuk Lee) ; (Jun-Sang Park) ; (Tai-Ji An) ; (Sung-Han Do) ; (Young-Jae Cho) ; (Michael Choi) ; (Gil-Cho Ahn) ; (Seung-Hoon Lee)
https://doi.org/10.5573/JSTS.2021.21.6.449
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