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The Journal of Semiconductor Technology and Science (JSTS) is an international, peer-reviewed, and open-access journal that is published bimonthly.
- Scope: semiconductor processes, devices, circuits, and MEMS.
- Editor-in-Chief: Prof. Woo Young Choi (ECE, Seoul National University)
- Indexed within Science Citation Index Expanded (SCIE), SCOPUS, Korea Citation Index (KCI), and other databases.

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2020-02

P.1

[Cover] Journal of Semiconductor Technology and Science(JSTS), Volume 20, Number 1, February 2020

편집부(Editor)
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P.1

[SPECIAL ISSUE] Bootstrapped Fully Differential CMOS Transimpedance Amplifier

Yoonji Park;Ji-Hoon Kim;Sung Min Park
https://doi.org/10.5573/JSTS.2020.20.1.001
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P.8

[SPECIAL ISSUE] Effect of Bottom Electrode Size on Ovonic Threshold Switch(OTS) Characteristics

Byung-Kwon An;Seong-Beom Kim;Yun-Heub Song
https://doi.org/10.5573/JSTS.2020.20.1.008
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P.12

[SPECIAL ISSUE] Enhancing Light-emission Stability of Metal-halide Perovskites with Size and Composition Engineering

Hoon Ryu
https://doi.org/10.5573/JSTS.2020.20.1.012
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P.19

[SPECIAL ISSUE] Reliability Analysis Framework for Time Dependent Dielectric Breakdown

Kiron Park;Sujin Im;Keonho Park;Kwonjoo Son;SeungEui Hong;Jongwook Jeon
https://doi.org/10.5573/JSTS.2020.20.1.019
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P.29

[SPECIAL ISSUE] A MIPI Receiver Bridge Chip Supporting 5-Gb/s/lane D-PHY and 3-Gsymbol/s/lane C-PHY

Seokwon Choi;Pil-Ho Lee;Jin-Wook Han;Sang-Dong Kim;Young-Chan Jang
https://doi.org/10.5573/JSTS.2020.20.1.029
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P.41

[SPECIAL ISSUE] Investigation of Line-edge Roughness Effects on Electrical Characteristics of Nanowire Tunnel FETs and MOSFETs

Jang Hyun Kim;Min Gyu Lee;Seong-Su Shin;Sangwan Kim
https://doi.org/10.5573/JSTS.2020.20.1.041
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P.47

[SPECIAL ISSUE] Downscaling Study of Uncooled a-Si Infrared Microbolometer Cell based on Simulation

Jun-Kyo Jeong;Byeong-Jun Jeong;Jae- Sub Oh;Ga-Won Lee
https://doi.org/10.5573/JSTS.2020.20.1.047
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P.55

[SPECIAL ISSUE] Supporting the Priorities in the Multi-queue Block I/O Layer for NVMe SSDs

Kyusik Kim;Seungkyu Hong;Taeseok Kim
https://doi.org/10.5573/JSTS.2020.20.1.055
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P.63

[REGULAR PAPER] An Improved LDPC ECC based on System Level Reprogramming for MLC NAND Flash

Jinuk Kim;Jihun Jung;Sungju Park
https://doi.org/10.5573/JSTS.2020.20.1.063
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