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The Journal of Semiconductor Technology and Science (JSTS) is an international, peer-reviewed, and open-access journal that is published bimonthly.
- Scope: semiconductor processes, devices, circuits, and MEMS.
- Editor-in-Chief: Prof. Woo Young Choi (ECE, Seoul National University)
- Indexed within Science Citation Index Expanded (SCIE), SCOPUS, Korea Citation Index (KCI), and other databases.

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Journal Archive

2026-08

P.239

An Improved SPICE Macro Model for Floating Body Partially Depleted SOI MOSFETs

(Wongi Cho) ; (Seonghearn Lee)
https://doi.org/10.5573/JSTS.2026.26.4.239
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P.249

Optimization of 28 nm FDSOI CMOS Inverter Design Using Deep Learning Algorithm

(Tae Young Yoon) ; (Kang Hee Lee) ; (Jun Seok Lee) ; (Mincheol Kim) ; (Yongyoon Choi) ; (Jang Hyun Kim)
https://doi.org/10.5573/JSTS.2026.26.4.249
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P.257

Optical Properties of Hexagonal MgxZn1−xO Thin Films Deposited by RF Reactive Magnetron Sputtering

(Hai Dang Ngo) ; (Bao Quan Tran) ; (Khac Binh Nguyen) ; (Hoai Phuong Pham) ; (Thi Kim Hang Pham)
https://doi.org/10.5573/JSTS.2026.26.4.257
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P.265

A 5.5 ppm/∘C, 4.5-nW Wide Temperature Range Sub-threshold CMOS Voltage Reference

(Balaramamurty Sannidhi) ; (G. V. K. Sharma)
https://doi.org/10.5573/JSTS.2026.26.4.265
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P.272

Design of Capacitorless Dynamic Random-Access Memory based on GAA JLFET with Vertically Stacked Storage Layer and Underlapped Gate Structure

(Won Suk Koh) ; (Jin Park) ; (Gang San Yun) ; (Soo Bean Song) ; (Kyeong Min Lim) ; (Sang Ho Lee) ; (Young Jun Yoon) ; (In Man Kang)
https://doi.org/10.5573/JSTS.2026.26.4.272
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P.283

Hot-Carrier Lifetime Prediction of P-Channel MOSFETs in the Subthreshold Region

(Yoon Tae Jeong) ; (Jae SeungWoo) ; (Jin Ho Chang) ; (Hye Sun Sung) ; (Hyo Jung Kim) ; (Seung Bo Shim) ; (Woo Young Choi)
https://doi.org/10.5573/JSTS.2026.26.4.283
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P.292

Voltage Control Scheme to Mitigate Thermal Effects in Hybrid Bonding 3D NAND

(Dohyun Kim) ; (Wonbo Shim)
https://doi.org/10.5573/JSTS.2026.26.4.292
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