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The Journal of Semiconductor Technology and Science (JSTS) is an international, peer-reviewed, and open-access journal that is published bimonthly.
- Scope: semiconductor processes, devices, circuits, and MEMS.
- Editor-in-Chief: Prof. Woo Young Choi (ECE, Seoul National University)
- Indexed within Science Citation Index Expanded (SCIE), SCOPUS, Korea Citation Index (KCI), and other databases.

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  3. 2025-02 (Vol.25 No.01)
  4. 10.5573/JSTS.2025.25.1.56
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References

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T. Na, J. Kim, J. P. Kim, S. H. Kang, and S.-O. Jung, ``Reference-scheme study and novel reference scheme for deep submicrometer STT-RAM,'' IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 61, no. 12, pp. 3376-3385, Dec. 2014.DOI
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T. Na, B. Song, J. P. Kim, S. H. Kang, and S.-O. Jung, ``Offset-canceling current-sampling sense amplifier for resistive nonvolatile memory in 65 nm CMOS,'' IEEE Journal of Solid-State Circuits, vol. 52, no. 2, pp. 496-504, Feb. 2017.DOI
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G. P. Devaraj, R. Kabilan, J. Z. Gabriel, U. Muthuraman, N. Muthukumaran, and R. Swetha, ``Design and analysis of modified pre-charge sensing circuit for STT-MRAM,'' Proc. of 2021 Third International Conference on Intelligent Communication Technologies and Virtual Mobile Networks (ICICV), Tirunelveli, India, pp. 507-511, 2021.DOI
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T. Na, S. H. Kang, and S.-O. Jung, ``STT-MRAM sensing: A review,'' IEEE Trans. Circuits Syst. II, Exp. Briefs, vol. 68, no. 1, pp. 12-18, Jan. 2021.DOI
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T. Na, J. P. Kim, S. H. Kang, and S.-O. Jung, ``Multiple-cell reference scheme for narrow reference resistance distribution in deep submicrometer STT-RAM,'' IEEE Transactions on Very Large Scale Integration (VLSI) Systems, vol. 24, no. 9, pp. 2993-2997, Sep. 2016.DOI