I. Hill, P. Chanawala, R. Singh, S. A. Sheikholeslam, and A. Ivanov, “CMOS Reliability
from Past to Future: A Survey of Requirements, Trends, and Prediction Methods,” IEEE
Transactions on Device and Materials Reliability, vol. 22, no. 1. Institute of Electrical
and Electronics Engineers Inc., pp. 1-18, Mar. 01, 2022. doi: 10.1109/TDMR.2021.3131345