Reliable Oscillatory Neural Network Utilizing a Thermally Stable Single Transistor-based
Oscillator
HanJoon-Kyu1
-
( System Semiconductor Engineering and Department of Electronic Engineering, Sogang
University, 35 Baekbeom-ro, Mapo-gu, Seoul 04107, Korea)
Copyright © The Institute of Electronics and Information Engineers(IEIE)
Index Terms
Neuromorphic computing system, single transistor latch (STL), single transistor-based oscillator (1Toscillator), oscillatory neural network (ONN), thermal stability
I. INTRODUCTION
Recently, there has been growing interest in oscillatory neural networks (ONNs) as
a solution to address the bottlenecks of von Neumann architecture in traditional computing
[1,2,3,4,5]. ONNs rely on the dynamics of coupled oscillators to emulate the interaction observed
among oscillating signals in the human brain. By utilizing the phases of oscillators
instead of signal amplitudes, ONNs offer the potential for significant improvements
in energy efficiency. Building ONNs as hardware requires artificial oscillators capable
of continuously generating oscillating signals, as depicted in Fig. 1(a). When these oscillators are coupled, their independently generated output signals
interact and synchronize over time according to the strength of their coupling. This
synchronization encodes information using the phase difference between the oscillators.
While ONNs based on complex complementary metal-oxide-semiconductor (CMOS) circuits
have been reported, they should have large hardware area and high power consumption
[6,7]. Alternatively, various oscillators utilizing compact devices such as metal-insulator
transition devices, resistive switching devices, and magnetic tunnel junction devices
have been proposed [8,9,10,11,12,13].
A bistable resistor is also a promising candidate for device-based oscillators because
it can be implemented using well-developed CMOS technology [14]. To induce oscillation in a bistable resistor, the single transistor latch (STL)
phenomenon is predominantly employed [15,16,17,18]. However, when STL is activated by impact ionization (I.I.), it becomes sensitive
to temperature due to the influence of temperature on the I.I. rate [19]. This thermal sensitivity poses a challenge for reliable computing. Similarly, thermal
instability is a persistent issue for other oscillator devices mentioned earlier.
For instance, metal-insulator transition devices and filamentary resistive switching
devices are also temperature-sensitive because their switching mechanisms are closely
tied to thermal dynamics [20,21]. Therefore, temperature regulation is essential to effectively utilize these devices
for ONNs because varying temperatures can lead to disparate outcomes. Specifically,
if the properties of the two coupled oscillators fluctuate due to temperature inconsistencies
across the chip, it can alter their synchronization status. This challenge exacerbates
when deploying ONNs in environments where temperature fluctuations are substantial.
In this work, a reliable ONN utilizing a thermally stable single transistor-based
oscillator (1T-oscillator) is demonstrated. By applying a high negative bias to the
gate electrode of the MOSFET, temperature invariant band-to-band tunneling (BTBT)
can be utilized to enable STL instead of the temperature sensitive I.I. [22]. The characteristics of coupled oscillators, where two oscillators are connected
with a coupling capacitor (${C}_{\rm c}$), as illustrated in Fig. 1(b), are investigated under varying temperatures based on simulations, reflecting the
measured oscillation properties of the 1T-oscillator. Finally, ONN for vertex coloring
is constructed to show its reliable operations against thermal variations.
Fig. 1. (a) Schematic of the oscillatory neural network (ONN). (b) The circuit structure
of coupled oscillators composes ONN. Single transistor-based oscillators (1T-oscillators)
are coupled with a coupling capacitor ($C_{\rm c}$) while applying input current ($I_{\rm
in}$) and monitoring output voltage ($V_{\rm out}$) to enable the oscillation behaviors.
$C_{\rm par}$ represents the parasitic capacitor.
II. RESULTS AND DISCUSSION
When the input current ($I_{\rm in}$) is applied to the oscillator utilizing STL such
as bistable resistors and MOSFETs, the drain voltage ($V_{\rm D}$) increases due to
the accumulation of positive charges, causing electrons to be emitted from the source
through thermionic emission, thus initiating I.I., as depicted in Fig. 2(a) [14,15]. Consequently, electron-hole pairs are created, with the resulting holes stored in
the floating body, reducing the potential barrier between the source and the floating
body. This leads to further injection of electrons into the floating body and amplifying
I.I., which constitutes a form of positive feedback. Therefore, as $V_{\rm D}$ reaches
the latch-up voltage ($V_{\rm latch}$), the oscillator undergoes a sudden transition
from a high-resistance state (HRS) to a low-resistance state (LRS), which is a common
procedure to trigger STL. Consequently, the output voltage ($V_{\rm out}$), corresponding
to $V_{\rm D}$, oscillates over time when $I_{\rm in}$ is applied, while the source
is grounded. However, the oscillation properties are sensitive to temperature variations
because both thermionic emission and the I.I. rate change with temperature [19]. Oscillation frequency tends to be higher at elevated temperatures since $V_{\rm
latch}$ decreases due to activated thermionic emission, as shown in Fig. 2(b). It is important to note that the measured oscillation characteristics in Fig. 2 are based on a previous paper [22]. In the previous paper, a vertical silicon nanowire gate-all-around MOSFET with a
diameter of 640 nm and a body length of 300 nm was used as the 1T-oscillator, where
the gate dielectric and polycrystalline silicon gate surrounded the silicon pillar
to form the floating body.
Fig. 2. (a) The energy band diagram under a gate voltage ($V_{\rm G}$) of $-1.5$ V,
which triggers the single transistor latch (STL) via impact ionization (I.I.). (b)
Measured and simulated oscillation behaviors at $25^\circ$C and $50^\circ$C with applied
$V_G$ of $-1.5$ V. (c) The energy band diagram under $V_{\rm G}$ of $-3$ V, triggering
STL via band-to-band tunneling (BTBT). (d) Measured and simulated oscillation behaviors
at $25^\circ$C and $50^\circ$C with applied $V_{\rm G}$ of $-3$ V.
Table 1. The parameters for simulation to model the oscillation behaviors.
In the MOSFET, the body potential can be controlled by adjusting the gate voltage
($V_{\rm G}$). Consequently, STL and oscillation characteristics are significantly
influenced by $V_{\rm G}$. When a highly negative $V_{\rm G}$ is applied, thermally
invariant BTBT can be used to trigger STL, rather than the thermally sensitive I.I.,
due to a notable energy bending between the floating body and the drain, as illustrated
in Fig. 2(c). Electrons emitted from the source to the floating body via thermionic emission are
effectively suppressed by the heightened potential barrier between the floating body
and the source. Instead, the holes generated by BTBT accumulate in the floating body,
prompting STL. Consequently, the oscillation characteristics remain stable irrespective
of temperature when applying $V_{\rm G}$ of $-3$ V, as shown in Fig. 2(d).
To validate the effectiveness of the thermally stable 1T-oscillator for ONN applications,
the oscillator was modeled as a voltage-controlled threshold switch along with a parallel
parasitic capacitor ($C_{\rm par}$) in SPICE simulation. All four measured cases shown
in Figs. 2(b) and 2(d) were modeled, with the simulated data closely aligning with the measured results.
The simulation parameters, including top oscillating voltage ($V_{\rm top}$), bottom
oscillating voltage ($V_{\rm bottom}$), on-state resistance ($R_{\rm on}$), $I_{\rm
in}$, and $C_{\rm par}$ for each case were summarized in Table 1. It should be noted that $V_{\rm top}$ and $V_{\rm bottom}$ are the same as $V_{\rm
latch}$ and the resting voltage in STL behavior [17,18]. Since $I_{\rm in}$ and $C_{\rm par}$ are constant regardless of the temperatures,
$V_{\rm top}$ and $V_{\rm bottom}$ are the most dominant parameter that impact on
the synchronization of oscillators.
Fig. 3. Coupled oscillator operations when STL was triggered by I.I. (applying $V_{\rm
G}$ of $-1.5$ V). $V_{\rm out}$-time when the temperatures of both oscillators 1 and
2 were (a) $25^\circ$C and (b) $50^\circ$C. (c) $V_{\rm out}$-time when the temperatures
of oscillator 1 and 2 were $25^\circ$C and $50^\circ$C, respectively. (d) The phase
difference between the two oscillators after 0.5 s.
Fig. 3 shows the oscillation characteristics of coupled oscillators triggered by STL using
I.I. (applying $V_{\rm G}$ of -1.5 V). As shown in Fig. 3(a), two oscillators (oscillators 1 and 2) were synchronized with a phase difference
close to 180$^\circ$. It should be noted that a 50 ms delay was applied between $I_{\rm
in}$ of the two oscillators to establish an initial signal difference. When the temperature
of both oscillators was elevated to 50 $^\circ$C, they are still synchronized but
phases were changed due to increased oscillation frequency attributed to lowered $V_{\rm
top}$, as shown in Fig. 3(b). A more significant issue arises when the temperatures of the two oscillators differ.
As shown in Fig. 3(c), two oscillators became asynchronized when oscillator 1 operates at $25^\circ$C and
oscillator 2 at $50^\circ$C. This discrepancy indicates that temperature non-uniformity
within the chip can disrupt synchronization, thereby compromising the reliability
of ONN. Fig. 3(d) represents the extracted phase difference between the two oscillators after 0.5 s,
showing synchronization when temperatures are equal and asynchronization when temperatures
differ.
Fig. 4. Coupled oscillator operations when STL was triggered by BTBT (applying $V_{\rm
G}$ of $-3$ V). $V_{\rm out}$-time when the temperatures of both oscillators 1 and
2 were (a) $25^\circ$C and (b) $50^\circ$C. (c) $V_{\rm out}$-time when the temperatures
of oscillators 1 and 2 were $25^\circ$C and $50^\circ$C, respectively. (d) The phase
difference between the two oscillators after 0.5 s.
Fig. 4 shows the oscillation characteristics of coupled oscillators triggered by STL using
BTBT (applying $V_{\rm G}$ of $-3$ V). As shown in Figs. 4(a)-4(c), two oscillators achieved synchronization with a phase difference close to $180^\circ$,
irrespective of temperature. This synchronization was due to the stable operation
of 1T-oscillators. Notably, synchronization persisted even when one oscillator operated
at $25^\circ$C and the other at $50^\circ$C. Hence, reliable operation of ONN is feasible
despite temperature variations.
$C_{\rm c}$ is the key parameter that governs the synchronization of coupled oscillators.
In practical ONN applications, $C_{\rm c}$ is adjusted based on the connectivity between
two nodes. Fig. 5 shows the phase difference between two oscillators as a function of $C_{\rm c}$,
with the oscillators at temperatures of $25^\circ$C and $50^\circ$C. The phase difference
was extracted at 0.5 s. Synchronization was observed over a wide range of $C_{\rm
c}$ values only when BTBT was used (applying $V_{\rm G}$ of $-3$ V). This suggests
that stable ONN performance can be maintained across different temperatures and $C_{\rm
c}$ values by utilizing BTBT.
Fig. 5. The phase difference between the two oscillators as a function of coupling
capacitance ($C_{\rm c}$) when the temperatures of the oscillators are $25^\circ$C
and $50^\circ$C.
Fig. 6. (a) Input graph showing vertex coloring when all oscillators were at a temperature
of $25^\circ$C. (b) $V_{\rm out}$-time and phase plot when STL was triggered by I.I.
(applying $V_{\rm G}$ of $-1.5$ V) for (a). (c) $V_{\rm out}$-time and phase plot
when STL was triggered by BTBT (applying $V_{\rm G}$ of $-3$ V) for (a). (d) Input
graph illustrating vertex coloring when the temperatures of oscillators 1, 3, and
5 were set to $25^\circ$C while those of oscillators 2 and 4 were set to $50^\circ$C.
(e) $V_{\rm out}$-time and phase plot when STL was triggered by I.I. (applying $V_{\rm
G}$ of $-1.5$ V) for (d). (f) $V_{\rm out}$-time and phase plot when STL was triggered
by BTBT (applying $V_{\rm G}$ of $-3$ V) for (d).
To demonstrate the reliability of ONN in practical applications, vertex coloring was
implemented. The vertex coloring problem is a well-known example of nondeterministic
polynomial time hard (NP-hard) combinatorial optimization problems [23,24,25]. Its objective is to assign different colors to nodes connected by edges, and it
finds applications in various fields such as scheduling, routing, and resource allocation.
Fig. 6(a) shows an input graph having five nodes interconnected by six edges. Each node in
this graph corresponds to an oscillator (labeled 1${\sim}$5), and when they are connected
by edges, $C_{\rm c}$ was placed between them. From the oscillation characteristics,
the phase of each oscillator was extracted with respect to the phase of $0^\circ$
in the reference oscillator 1, and the phase plots were drawn. Whenever the phase
difference between two oscillators exceeded $90^\circ$, different colors were assigned
to the corresponding nodes.
As shown in Figs. 6(b) and 6(c), successful coloring was achieved for both cases by applying $V_{\rm G}$ of $-1.5$
V and $-3$ V when all oscillator temperatures were set to $25^\circ$C. Fig. 6(d) shows the same input graph, but with varying oscillator temperatures: oscillators
1, 3, and 5 were at $25^\circ$C, while oscillators 2 and 4 were at $50^\circ$C. When
STL was triggered by I.I. (applying $V_{\rm G}$ of $-1.5$ V), coloring failed because
the oscillators corresponding to connected nodes were asynchronized due to different
temperatures, as shown in Fig. 6(e). Otherwise, when STL was triggered by BTBT (applying $V_{\rm G}$ of $-3$ V), successful
coloring was achieved with the correct answer because the oscillation characteristics
remained unchanged, and the oscillators corresponding to the connected nodes were
synchronized, as shown in Fig. 6(f). Therefore, a reliable ONN was implemented using thermally stable 1T-oscillators.
It should be noted that the solution time can be decreased by increasing $I_{\rm in}$
to increase the oscillation frequency [15].
III. CONCLUSIONS
In this work, a method to enhance the reliability of ONN was demonstrated using the
thermally stable 1T-oscillator. Depending on the gate voltage, there were two mechanisms
for supplying holes into the floating body and triggering STL: I.I. with low negative
gate voltage and BTBT with high negative gate voltage. When STL was triggered by the
thermally invariant BTBT, stable oscillation characteristics and coupled oscillator
operations were achieved. Finally, reliable ONN operation was attained even with varying
temperatures, as confirmed through vertex coloring tasks. This work will pave the
way to establish a design guideline for creating reliable neuromorphic systems.
ACKNOWLEDGMENTS
This work was supported by the National Research Foundation of Korea(NRF) grant (RS2024-00334953,
2009-0082580) and MSIT(Ministry of Science and ICT), Korea, under the ITRC(Information
Technology Research Center) support program(IITP-2024-RS-2023-00260091) supervised
by the IITP(Institute for Information & Communications Technology Planning & Evaluation).
This work was also supported in part by LUXROBO Co., Ltd. EDA tool was supported by
IC Design Education Center (IDEC), Korea
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Joon-Kyu Han is an assistant professor in System Semiconductor Engineering and Department
of Electronic Engineering at Sogang University. His research focuses on (1) neuromorphic
device & system, (2) nano CMOS for logic & memory, and (3) 3D integration. He graduated
Summa Cum Laude from Korea Advanced Science and Technology (KAIST) in 2017 with a
Bachelor of Science in Electrical Engineering. He obtained his Master’s and Ph.D.
in Electrical Engineering at the KAIST in 2019 and 2023, respectively. He was a postdoctoral
researcher at Seoul National University and visiting scholar at Harvard University
from 2023 to 2024. He received Ph.D. Dissertation Award at KAIST College of Engineering
and Excellent Paper Awards from Samsung Electronics in 2021 and 2022.