Mobile QR Code QR CODE

The Journal of Semiconductor Technology and Science (JSTS) is an international, peer-reviewed, and open-access journal that is published bimonthly.
- Scope: semiconductor processes, devices, circuits, and MEMS.
- Editor-in-Chief: Prof. Woo Young Choi (ECE, Seoul National University)
- Indexed within Science Citation Index Expanded (SCIE), SCOPUS, Korea Citation Index (KCI), and other databases.

Journal Search

  1. Home
  2. Archive
  3. JSTS 2025-04(Vol.25 No.02)
PDF INFO
Title Fault-tolerant Algebraic Interleaver Architecture for IDMA Systems in Harsh Environments
Authors (Byeong Yong Kong)
DOI https://doi.org/10.5573/JSTS.2025.25.2.191
Page pp.191-198
ISSN 1598-1657
Keywords Fault tolerance; interleave division multiple access (IDMA); interleaver; multiuser detection (MUD); nonorthogonal multiple access (NOMA)
Abstract In this paper, a fault-tolerant algebraic interleaver architecture is presented for interleave division multiple access (IDMA) systems operating in harsh environments. Since the multiuser detection procedure is performed chipby-chip according to an interleaving pattern, it is of paramount importance to keep track of the current index at all times. To protect the interleaving index in a register from soft errors, an encoder and a decoder associated with an error-correcting code are added. Moreover, to mitigate the latency overhead of such an architecture, the encoder is merged with an essential logic that precomputes the next index. As a result, the proposed interleaver tolerates soft errors while suppressing the latency overhead.