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REFERENCES

1 
Zhu Y. , He Y. , Jiang S. , Zhu L. , Chen C. , Wan Q. , 2021, Indium–gallium–zinc–oxide thin-film transistors: Materials, devices, and applications, Journal of Semiconductors, Vol. 42, No. 3, pp. 031101DOI
2 
Kaçar R. , Serin R. B. , Uçar E. , Artuç M. , Ülkü A. , Kınacı B. , 2025, OLED-on-silicon (OLEDoS) microdisplays: Technology challenges, design considerations, and adaptation in eXtended Reality (XR) ecosystem, Next Nanotechnology, Vol. 7, pp. 100132DOI
3 
Park S. , Bang S. , Lee S. , Park J. , Ko Y. , Jeon H. , 2011, The effect of annealing ambient on the characteristics of an indium–gallium–zinc oxide thin film transistor, Journal of Nanoscience and Nanotechnology, Vol. 11, No. 7, pp. 6029-6033DOI
4 
Rao L. K. , Vinni V. , 1993, Novel mechanism for high speed growth of transparent and conducting tin oxide thin films by spray pyrolysis, Applied Physics Letters, Vol. 63, No. 5, pp. 608-610DOI
5 
Cebulla R. , Werndt R. , Ellmer K. , 1998, Investigation of reactive magnetron sputtered zinc oxide films, Journal of Applied Physics, Vol. 83, No. 2, pp. 1087-1095Google Search
6 
Bang S. , Lee S. , Park J. , Park S. , Jeong W. , Jeon H. , 2009, Investigation of the effects of interface carrier concentration on ZnO thin film transistors fabricated by atomic layer deposition, Journal of Physics D: Applied Physics, Vol. 42, No. 23, pp. 235102DOI
7 
Chen M. , Pei Z. L. , Sun C. , Wen L. S. , Wang X. , 2000, Surface characterization of transparent conductive oxide Al-doped ZnO films, Journal of Crystal Growth, Vol. 220, pp. 254-262DOI
8 
Fan J. C. C. , Goodenough J. B. , 1977, X-ray photoemission spectroscopy studies of Sn-doped In2O3 films, Journal of Applied Physics, Vol. 48, No. 8, pp. 3524-3531Google Search
9 
Lee S. , Bang S. , Park J. , Park S. , Jeong W. , Jeon H. , 2010, The effect of oxygen remote plasma treatment on ZnO TFTs fabricated by atomic layer deposition, Physica Status Solidi (a): Applications and Materials Science, Vol. 207, No. 8, pp. 1845-1849DOI
10 
Islam M. N. , Ghosh T. B. , Chopra K. L. , Acharya H. N. , 1996, XPS and X-ray diffraction studies of aluminum-doped zinc oxide transparent conducting films, Thin Solid Films, Vol. 280, pp. 20-25DOI
11 
Nomura K. , Kamiya T. , Yanagi H. , Ikenaga E. , Yang K. , Kobayashi K. , Hirano M. , Hosono H. , 2008, Subgap states in transparent amorphous oxide semiconductor, In–Ga–Zn–O, observed by bulk sensitive X-ray photoelectron spectroscopy, Applied Physics Letters, Vol. 92, No. 20, pp. 202117DOI
12 
Lee S. , Bang S. , Park J. , Park S. , Jeong W. , Jeon H. , 2010, The effect of oxygen remote plasma treatment on ZnO TFTs fabricated by atomic layer deposition, Physica Status Solidi (a): Applications and Materials Science, Vol. 207, No. 8, pp. 1845-1849DOI