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The Journal of Semiconductor Technology and Science (JSTS) is an international, peer-reviewed, and open-access journal that is published bimonthly.
- Scope: semiconductor processes, devices, circuits, and MEMS.
- Editor-in-Chief: Prof. Woo Young Choi (ECE, Seoul National University)
- Indexed within Science Citation Index Expanded (SCIE), SCOPUS, Korea Citation Index (KCI), and other databases.

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  4. 10.5573/JSTS.2025.25.5.616
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References

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2 
K. E. Lozada, J. Ramos, and M. P. Flynn, ``A 4th-order continuous-time delta-sigma modulator with hybrid noise coupling,'' IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 69, no. 9, pp. 3635--3639, September 2022.DOI
3 
Y. Cheng, C. Petrie, B. Nordick, and D. Comer, ``Multibit delta-sigma modulator with two-step quantization and segmented DAC,'' IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 53, no. 9, pp. 848--852, September 2006.DOI
4 
L. He, J. Liu, M. P. Flynn, and L. R. Carley, ``Digital noise-coupling technique for delta–sigma modulators with segmented quantization,'' IEEE Transactions on Circuits and Systems II: Express Briefs, vol. 61, no. 6, pp. 403--407, June 2014.DOI
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6 
H.-K. Hong, Y.-D. Jeon, S.-T. Ryu, and G.-H. Cho, ``A decision-error-tolerant 45 nm CMOS 7-bit 1 GS/s nonbinary 2-bit/cycle SAR ADC,'' IEEE Journal of Solid-State Circuits, vol. 50, no. 2, pp. 543--555, February 2015.DOI
7 
H. Zhuang, Y. Zhu, S.-W. Sin, U.-F. Chio, and R. P. Martins, ``A second-order noise-shaping SAR ADC with passive integrator and tri-level voting,'' IEEE Journal of Solid-State Circuits, vol. 54, no. 6, pp. 1636--1647, June 2019.DOI
8 
W.-Y. Pang, C.-S. Wang, Y.-K. Chang, N.-K. Chou, and C.-K. Wang, ``A 10-bit 500-kS/s low-power SAR ADC with splitting comparator for biomedical applications,'' in Proceedings of the IEEE Asian Solid-State Circuits Conference, Taipei, Taiwan, pp. 149--152, November 2009.DOI
9 
Y.-S. Shu, L.-T. Kuo, and T.-Y. Lo, ``An oversampling SAR ADC with DAC mismatch error shaping achieving 105 dB SFDR and 101 dB SNDR over 1 kHz bandwidth in 55 nm CMOS,'' IEEE Journal of Solid-State Circuits, vol. 51, no. 12, pp. 2928--2940, December 2016.DOI
10 
J. Liu, C.-K. Hsu, X. Tang, S. Li, G. Wen, and N. Sun, ``Error-feedback mismatch error shaping for high-resolution data converters,'' IEEE Transactions on Circuits and Systems I: Regular Papers, vol. 66, no. 4, pp. 1342--1354, April 2019.DOI