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  1. Department of Electrical and Electronics Engineering, Kangwon National University, Chuncheon, South Korea
  2. Department of Electronics Engineering, Kangwon National University, Chuncheon, South Korea



Batch Bayesian optimization, phase-locked loop (PLL), integrated phase noise (IPN), trimming

I. INTRODUCTION

Minimizing the integrated phase noise (IPN) of radio frequency (RF) phase-locked loops (PLLs) is essential for high-performance wireless systems. This optimization typically occurs after fabrication through on-chip trimming [1], where circuit biases, such as charge pump (CP) currents or loop filter (LF) parameters, are trimmed using discrete, hardware-constrained configuration codes. Effective trimming enables the RF PLL to enhance performance across different boards and achieve optimal noise characteristics. However, identifying the best configuration is time-intensive, as each requires a full phase noise measurement, and the search space is discrete and hardware-limited.

Prior work [2] has shown that sequential Bayesian optimization (BO) can significantly reduce the number of measurements required for finding an IPN-minimizing configuration compared to a full sweep of all codes. In this study, we extended this by investigating batch BO, proposing multiple candidate configurations ($q > 1$) per iteration. Although batch BO is typically motivated by the availability of parallel workers such as multiple instruments or several nominally identical devices under test (DUTs), our results reveal that, even in a single-instrument setting, an appropriately selected $q$ can reduce overall measurements compared to sequential BO to reach the same optimization target. This implies that batch BO is particularly useful for limited measurement budgets.

Theoretical and empirical studies support this observation. It has been shown that batch BO can be nearly as measurement-efficient as sequential BO, even with large batch sizes [3]. Additionally, empirical evaluations have shown that batch BO frequently matches or surpasses sequential BO under equivalent measurement budget [4- 6]. This efficiency arises because batch selection distributes candidates across the design space, mitigating redundancy. Consequently, joint selection diversifies early evaluations and prioritizes top candidates, reducing redundant measurements.

Prior batch BO studies have primarily examined algorithmic properties under idealized evaluation settings, including measurement efficiency and tail performance under matched evaluation budgets. In this work, we investigate batch BO from a deployment perspective for post-fabrication RF-PLL tuning, where objective evaluations require expensive instrument measurements and the configuration variables are bounded and discrete. Moreover, our setup follows a queued single-instrument workflow, in which candidates are proposed in batches but executed sequentially without intermediate feedback within a batch. Under this practical constraint, we empirically characterize how the batch size $q$ impacts early-stage progress, tail robustness, and computational overhead under a fixed physical-measurement budget, and we provide simple guidelines for choosing $q$ in single-instrument tuning.

The remainder of the paper is organized as follows. Section II reviews IPN in RF PLLs. Section III describes the proposed batch BO method, including joint acquisition and optimization. Section IV details the experimental setup and presents results and discussion. Finally, Section V presents conclusions of this study.

II. IPN IN RF PLLS

1. PLL Architecture

Fig. 1 shows an RF PLL architecture, composed of a phase frequency detector (PFD), CP, LF, voltage controlled oscillator (VCO), and multi-modulus divider (MMD). The PFD compares the reference clock $S_{\text{REF}}$ with the divided feedback clock $S_{\text{DIV}}$, generating UP and DN pulses proportional to their phase difference. These pulses drive the CP, converting them into a current $I_{\text{CP}}$ that is integrated by the LF to generate the control voltage $V_{\text{CTRL}}$ for the VCO. Subsequently, the frequency of the VCO output signal $S_{\text{VCO}}$ is divided by the MMD, and the resultant signal is fed back to the PFD, completing the feedback loop. A delta-sigma modulator (DSM) receives the frequency control word $D_{\text{FCW}}$ as the target value and generates a fractional division ratio $D_{\text{MMD}}$, which is supplied to the divider to perform fractional-$N$ operation [7, 8].

Fig. 1. Overall architecture of the radio frequency (RF) phase-locked loop (PLL) employing a charge pump (CP).

../../Resources/ieie/JSTS.2026.26.5.327/fig1.png

Fig. 2. Digitally trimmable CP structure used in the RF PLL with up-current source (UCS), down-current source (DCS), and CP current bias (CPCB) control.

../../Resources/ieie/JSTS.2026.26.5.327/fig2.png

Fig. 2 details the CP within the CP–PLL, comprising an up-current source (UCS) and a down-current source (DCS), both digitally programmable for post-fabrication trimming. UCS and DCS comprise $M_S$ identical unit current sources connected in parallel, with each gated by a dedicated on/off switch. A CP current bias (CPCB), programmed via the integer code $m_B \in \{1, \ldots, M_B\}$, sets the unit-current magnitude $I_{\text{unit}}(m_B)$, yielding $M_B$ discrete levels. With $m_{\text{UP}}$ and $m_{\text{DN}}$ units enabled in the UCS and DCS, respectively, the resulting currents are calculated as

(1)
$I_{\text{UP}} = m_{\text{UP}} \cdot I_{\text{unit}}(m_B) \quad \text{and} \quad I_{\text{DN}} = m_{\text{DN}} \cdot I_{\text{unit}}(m_B),$

where $m_{\text{UP}}$ and $m_{\text{DN}} \in \{1, \ldots, M_S\}$.

Recalling that the UP and DN pulses gate the CP as shown in Fig. 1, the instantaneous $I_{\text{CP}}$ is governed by the UP and DN pulse states and the programmed values of $I_{\text{UP}}$ and $I_{\text{DN}}$. During the UP pulse, CP sources current into LF; during the DN pulse, it sinks current from LF; otherwise, it remains ideally off. When averaged over a reference cycle, the net current is approximately proportional to the difference between the UP and DN pulse areas. Hence, the CP, combined with the PFD, delivers effective phase-detector gain. This gain, together with the LF and VCO gains, determines the PLL bandwidth. Increasing the unit current via the CPCB or enabling more units enhances this gain, widening bandwidth with the usual spur and stability tradeoffs.

In practice, $I_{\text{UP}}$ and $I_{\text{DN}}$ are trimmed independently, correcting residual mismatches or intentionally introducing small offsets between the UCS and DCS branches. A deliberate offset shifts the steady-state phase error away from the PFD dead zone, mitigating the phase-detector nonlinearity that leads to DSM noise folding [9]. To limit static phase error and reference spurs, the offset remains small. In addition, the discrete trimming codes as

$(m_{\text{UP}}, m_{\text{DN}}, m_B)$

determine the effective CP gain and thus the loop-bandwidth.

2. Definition of IPN

IPN quantifies the total phase noise power integrated within the specified frequency offset range and serves as a key figure of merit for PLLs. For a given single-sideband phase noise spectrum $L(f)$ (in dBc/Hz) over the offset range $f_1 \le f \le f_2$, the IPN is defined as

(2)
$\text{IPN} = 10 \log_{10} \left( \int_{f_1}^{f_2} 10^{\frac{L(f)}{10}} df \right) \quad (\text{dBc}).$

It correlates directly with the root mean squared timing jitter and overall PLL output spectral purity.

The IPN strongly depends on the PLL loop bandwidth $f_{\text{BW}}$, influencing the crossover between in-band and out-of-band noise sources. A narrow $f_{\text{BW}}$ reveals dominant in-band noise from the PFD and CP, whereas a wider $f_{\text{BW}}$ suppresses VCO noise but raises the in-band noise floor. Therefore, an optimal loop bandwidth that minimizes the IPN exists [10].

III. OVERVIEW OF BO METHOD

This section describes the BO method used in this study. We first review the sequential BO ($q = 1$), where $q$ is the batch size (number of proposed candidates per iteration), and extend it to the batch case ($q > 1$) using joint optimization [11].

1. Sequential BO Method ($q = 1$)

Let $\mathcal{M}$ and $\mathbf{x} \in \mathbb{R}^p$ denote the discrete codebook of trimming configurations and a continuous relaxation of a code $\mathbf{m} \in \mathcal{M}$, respectively. We define a snapping operator $Q_{\mathcal{M}} : \mathbb{R}^p \to \mathcal{M}$ that maps a continuous query to the nearest feasible code (e.g., component-wise rounding). A physical measurement at a continuous query $\mathbf{x}$ returns

(3)
$y = f(Q_{\mathcal{M}}(\mathbf{x})),$

where $f : \mathcal{M} \to \mathbb{R}$ is the (unknown) code-level objective. Equivalently, the surrogate in BO models the composite function

(4)
$g(\mathbf{x}) = f(Q_{\mathcal{M}}(\mathbf{x})), \quad \mathbf{x} \in \mathbb{R}^p,$

which is piecewise-constant over the quantization cells induced by $Q_{\mathcal{M}}$.

Given the dataset $\mathcal{D}_n = \{(\mathbf{x}_i, y_i)\}_{i=1}^n$ with $\mathbf{X}_n = [\mathbf{x}_1 \cdots \mathbf{x}_n]$ and $\mathbf{y}_n = [y_1 \cdots y_n]^\top$, we place a Gaussian process (GP) prior on $g(\cdot)$ over $\mathbb{R}^p$ and obtain the usual Gaussian posterior

(5)
$g(\mathbf{x}) \mid \mathcal{D}_n \sim \mathcal{N}\left( \mu_n(\mathbf{x}), \sigma_n^2(\mathbf{x}) \right),$

with

$\mu_n(\mathbf{x}) = \mu_0 + \mathbf{k}(\mathbf{x}, \mathbf{X}_n) \mathbf{K}_n^{-1}(\mathbf{y}_n - \mu_0 \mathbf{1}_n),$

$\sigma_n^2(\mathbf{x}) = k(\mathbf{x}, \mathbf{x}) - \mathbf{k}(\mathbf{x}, \mathbf{X}_n) \mathbf{K}_n^{-1} \mathbf{k}(\mathbf{x}, \mathbf{X}_n)^\top,$

where $\mathbf{k}(\mathbf{x}, \mathbf{X}_n) = [k(\mathbf{x}, \mathbf{x}_1) \cdots k(\mathbf{x}, \mathbf{x}_n)]$, $k(\cdot, \cdot)$ is a positive-definite covariance kernel on $\mathbb{R}^p$ (e.g., squared-exponential or Matérn) [11], $\mathbf{K}_n = [k(\mathbf{x}_i, \mathbf{x}_j)]_{i,j=1}^n$, $\mu_0 \in \mathbb{R}$ is a constant prior mean, and $\mathbf{1}_n$ is the $n$-dimensional all-ones vector. Accordingly, $\mu_n(\mathbf{x})$ is the predicted black-box function value, whereas $\sigma_n^2(\mathbf{x})$ quantifies its predictive uncertainty.

Based on (5), we use a standard acquisition, expected improvement (EI) as

(6)
$\alpha(\mathbf{x} \mid \mathcal{D}_n) = \text{EI}_n(\mathbf{x}) = \mathbb{E}\left[ \left( g(\mathbf{x}) - f_{\max}^{(n)} \right)_+ \mid \mathcal{D}_n \right],$

where $f_{\max}^{(n)} = \max_{i \in \{1, \ldots, n\}} y_i$ and $(u)_+ = \max\{0, u\}$. Equivalently,

(7)
$\text{EI}_n(\mathbf{x}) = \left(\mu_n(\mathbf{x}) - f_{\max}^{(n)}\right)\Phi(z_n(\mathbf{x})) + \sigma_n(\mathbf{x})\phi(z_n(\mathbf{x})),$

where $z_n(\mathbf{x}) = \left(\mu_n(\mathbf{x}) - f_{\max}^{(n)}\right) / \sigma_n(\mathbf{x})$ and $\phi(\cdot)$ and $\Phi(\cdot)$ denote the standard normal probability density and cumulative density functions, respectively. Then, we solve

(8)
$\mathbf{x}_{(n+1)}^* = \arg\max_{\mathbf{x} \in \Omega} \alpha(\mathbf{x} \mid \mathcal{D}_n),$

where $\Omega \subset \mathbb{R}^p$ is the continuous search domain, snap the maximizer as

(9)
$\mathbf{m}_{(n+1)} = Q_{\mathcal{M}}\left(\mathbf{x}_{(n+1)}^*\right),$

and perform a single physical measurement at $\mathbf{m}_{(n+1)}$,

(10)
$y_{(n+1)} = f\left(\mathbf{m}_{(n+1)}\right).$

Finally, we update the dataset by attaching the result to the original continuous query as

(11)
$\mathcal{D}_{(n+1)} = \mathcal{D}_n \cup \left\{ \left(\mathbf{x}_{(n+1)}^*, y_{(n+1)}\right) \right\}.$

The selection loop (8)–(11) repeats until a stopping criterion is met.

In addition, we track the cumulative number of physical measurements, $B$. Under the snap-and-attach policy, if $\mathbf{x}_{(n+1)}^*$ snaps to a code that has been measured previously, we reuse its recorded measurement and do not increment $B$, although a new pair $\left(\mathbf{x}_{(n+1)}^*, y_{(n+1)}\right)$ is still added to the dataset. Accordingly, different continuous queries may snap to the same discrete code, i.e., $Q_{\mathcal{M}}(\mathbf{x}) = Q_{\mathcal{M}}(\mathbf{x}')$ for $\mathbf{x} \neq \mathbf{x}'$, while remaining distinct training inputs in the surrogate. Further discussion is provided in Section III-3.

2. Batch BO Method ($q > 1$)

In a batch setting, each BO iteration proposes $q$ continuous queries collected into a column-stacked matrix $\mathbf{X}^{(1:q)} = \left[ \mathbf{x}^{(1)} \cdots \mathbf{x}^{(q)} \right] \in \mathbb{R}^{p \times q}$. After $n$ iterations, the dataset size is $N = nq$, where $N$ denotes the current number of continuous query–response pairs and increases by $q$ after each batch update. Thus, we maintain $\mathcal{D}_N = \{(\mathbf{x}_i, y_i)\}_{i=1}^N$ with $\mathbf{X}_N = [\mathbf{x}_1 \cdots \mathbf{x}_N]$ and $\mathbf{y}_N = [y_1 \cdots y_N]^\top$. In contrast, we define $B$ as the cumulative number of physical measurements, which can be smaller than $N$ due to duplicate snapped codes.

We use the same GP surrogate $g(\cdot)$ as in the sequential case, defined in (4), and consider the joint GP posterior over the batch $\mathbf{X}^{(1:q)}$ is given by [11]

(12)
$\mathbf{g}\left(\mathbf{X}^{(1:q)}\right) \mid \mathcal{D}_N \sim \mathcal{N}\left(\boldsymbol{\mu}_N\left(\mathbf{X}^{(1:q)}\right), \boldsymbol{\Sigma}_N\left(\mathbf{X}^{(1:q)}\right)\right),$

where

$\mathbf{g}\left(\mathbf{X}^{(1:q)}\right) = \left[ g\left(\mathbf{x}^{(1)}\right) \cdots g\left(\mathbf{x}^{(q)}\right) \right]^\top,$

$\boldsymbol{\mu}_N\left(\mathbf{X}^{(1:q)}\right) = \mu_0 \mathbf{1}_q + \mathbf{K}\left(\mathbf{X}^{(1:q)}, \mathbf{X}_N\right) \mathbf{K}_N^{-1}(\mathbf{y}_N - \mu_0 \mathbf{1}_N),$

and

$\boldsymbol{\Sigma}_N\left(\mathbf{X}^{(1:q)}\right) = \mathbf{K}\left(\mathbf{X}^{(1:q)}, \mathbf{X}^{(1:q)}\right) \\ - \mathbf{K}\left(\mathbf{X}^{(1:q)}, \mathbf{X}_N\right) \mathbf{K}_N^{-1} \mathbf{K}\left(\mathbf{X}_N, \mathbf{X}^{(1:q)}\right).$

Here, $\mathbf{K}(\mathbf{A}, \mathbf{B})$ is the Gram matrix with $[\mathbf{K}(\mathbf{A}, \mathbf{B})]_{ij} = k(\mathbf{a}_i, \mathbf{b}_j)$. Given (12), the batch extension of EI, namely $q\text{EI}$, is defined as

(13)
$\alpha^{(q)}\left(\mathbf{X}^{(1:q)} \mid \mathcal{D}_N\right) = q\text{EI}_N\left(\mathbf{X}^{(1:q)}\right) = \mathbb{E}\left[ \left( \max_{j \in \{1, \ldots, q\}} g\left(\mathbf{x}^{(j)}\right) - f_{\max}^{(N)} \right)_+ \mid \mathcal{D}_N \right],$

where $f_{\max}^{(N)} = \max_{i \in \{1, \ldots, N\}} y_i$. For $q > 1$, $q\text{EI}$ is approximated numerically (e.g., via Monte Carlo) [4]. Then, we solve

(14)
$\mathbf{X}^{(1:q)*} = \arg\max_{\mathbf{X}^{(1:q)} \in \Omega^q} \alpha^{(q)}\left(\mathbf{X}^{(1:q)} \mid \mathcal{D}_N\right),$

where $\Omega^q = \Omega \times \cdots \times \Omega$ for the $q$-fold product set, and snap each column to the discrete configurations as

(15)
$\mathbf{M}_{(n+1)} = \left[ \mathbf{m}^{(1)} \cdots \mathbf{m}^{(q)} \right] = \left[ Q_{\mathcal{M}}\left(\mathbf{x}^{(1)*}\right) \cdots Q_{\mathcal{M}}\left(\mathbf{x}^{(q)*}\right) \right].$

Within a batch, multiple continuous queries may snap to the same discrete code, and some codes may have been measured before. Let $\mathcal{U}_{n+1}$ be the set of unique codes in $\mathbf{M}_{(n+1)}$ that have not been measured up to iteration $n$. We perform one physical measurement for each $\mathbf{u} \in \mathcal{U}_{n+1}$ to obtain $y = f(\mathbf{u})$. For every $j \in \{1, \ldots, q\}$, we assign to the dataset the response associated with its snapped code as

(16)
$y_{(N+j)} = f\left(\mathbf{m}^{(j)}\right),$

which may reuse a previously recorded value and therefore does not necessarily increment $B$. Then, we update the dataset by pairing each response value with the original continuous query as

(17)
$\mathcal{D}_{(N+q)} = \mathcal{D}_N \cup \left\{ \left(\mathbf{x}^{(j)*}, f\left(\mathbf{m}^{(j)}\right)\right) \right\}_{j=1}^q.$

Therefore, the dataset grows by $q$ entries per iteration (total size of $(N + q)$), whereas the number of physical measurements in that iteration equals $|\mathcal{U}_{n+1}| \le q$. Accordingly, over $n$ iterations, we have $B = \sum_{i=1}^n |\mathcal{U}_i| \le N$. The GP surrogate is derived on $\mathcal{D}_N$, so it leverages $N = nq$ continuous query–response pairs, even when only $B$ unique physical measurements are performed. With this update rule, the batch-selection loop (14)–(17) repeats until a stopping criterion is met.

As mentioned in Section I, joint batch selection spreads early evaluations across multiple promising regions while still prioritizing high-value candidates, which reduces redundancy and can approach the measurement efficiency of sequential BO [3].

3. Addressing Quantization-Induced Duplicates

Quantization via $Q_{\mathcal{M}}(\cdot)$ can map different continuous queries to the same discrete code, which may cause previously evaluated codes to be selected again. A simple alternative is to build the surrogate directly on the discrete codebook, using the snapped code as the input and the corresponding measurement as the output. This discrete-input formulation is often natural in trimming problems because the DUT can only be programmed with discrete codes and physical measurements are obtained only at those code settings. Accordingly, the dataset update takes the form

(18)
$\mathcal{D}_{(N+q)}^{\text{disc}} = \mathcal{D}_N^{\text{disc}} \cup \left\{ \left(\mathbf{m}^{(j)}, f\left(\mathbf{m}^{(j)}\right)\right) \right\}_{j=1}^q.$

Under this formulation, if quantization yields a code that has already been evaluated, the candidate must be dropped (or replaced) because it does not provide a new input–output pair for updating the surrogate.

In contrast, our proposed snap-and-attach policy optimizes in the continuous domain and pairs each continuous query with the measurement at its snapped code. Therefore, even when multiple continuous queries snap to the same previously measured code, we can reuse the recorded measurement without performing additional physical measurements and still add new training pairs to the surrogate, as in (17). In additional comparative experiments not reported here, the simple dropping strategy degraded performance relative to snap-and-attach. This result suggests that retaining these additional continuous-labeled pairs improves sample efficiency and surrogate calibration without increasing the physical measurement budget.

IV. EXPERIMENT RESULTS

1. IPN Measurement Setup

Fig. 3 illustrates the setup to automatically measure the IPN of the RF PLL. A DC power supply delivers a stable voltage to the motherboard, which powers the DUT board and serial peripheral interface (SPI) control module. The control personal computer (PC) runs the batch BO procedure that proposes trimming-code candidates. Then, the selected trimming-code vector is written to the DUT over SPI, thereby setting $I_{\text{CP}}$ and, in turn, the PLL loop bandwidth.

After applying the trimming codes, the corresponding phase noise spectrum is measured using a phase-noise analyzer (PNA). A Python-based automation framework manages SPI configuration, measurement control, and IPN evaluation. The PNA trace is transferred to the PC over general purpose interface bus, stored, and post-processed to compute IPN according to (2), allowing fully automated and repeatable IPN measurements across various boards and trimming code configurations.

To establish a per-board reference for the best attainable IPN through a full sweep of the trimming codes, we exhaustively evaluated three DUT boards (A, B, and C). The sweep range per code was limited to 20 representative values, yielding $20^3 = 8,000$ measurements per DUT board. Figs. 4(a), (b), and (c) show the measured IPN with the trimming codes for the three DUT boards. These figures show that while the overall trimming behavior is consistent across boards, the specific code combination that minimizes IPN differ for each board due to process-induced variations. Specifically, the optimal codes for boards A, B, and C are $(19, 2, 14)$, $(20, 4, 20)$, $(18, 3, 19)$, respectively, and their corresponding minimum IPNs are $-37.94$, $-38.60$, and $-38.01\text{ dBc}$, respectively. This confirms that post-fabrication trimming is an effective means to optimize PLL noise performance while compensating for silicon variation.

Fig. 3. Measurement setup for the integrated phase noise (IPN) of RF PLL.

../../Resources/ieie/JSTS.2026.26.5.327/fig3.png

Fig. 4. Measured IPN with the trimming codes for three RF PLL boards. (a) Board A. (b) Board B. (c) Board C.

../../Resources/ieie/JSTS.2026.26.5.327/fig4.png

The full sweep also suggests that the IPN-loss landscape is moderately smooth yet nonconvex, and it exhibits anisotropic sensitivity across the trimming dimensions with local variations induced by discretization and measurement variability. This qualitative structure motivates using a kernel that is flexible enough to capture local irregularities while remaining sufficiently smooth for stable acquisition optimization.

We employed a GP surrogate with an automatic relevance determination (ARD) Matérn-5/2 covariance kernel, and kernel hyperparameters were re-estimated during the BO loop. We selected Matérn-5/2 because it provides a practical balance between smoothness and flexibility for measurement-driven optimization. The Matérn family controls smoothness via $\nu$ and recovers the radial basis function (RBF) kernel as $\nu \to \infty$ [12]. In our quantized trimming setting, Matérn-5/2 avoids overly strong smoothness assumptions of RBF while remaining sufficiently smooth for stable acquisition optimization. Prior BO studies have also noted that the GP prior, including the kernel choice, can materially affect optimization performance [13]. In additional comparative experiments not reported here, we further verified this choice empirically by comparing Matérn-5/2 against Matérn-3/2 and RBF under the same BO settings, observing consistently improved mean and tail performance for Matérn-5/2.

2. Comparison Methodology

Because batch BO proposes $q$ continuous queries per iteration (which are snapped to discrete trimming codes), iteration counts are not directly comparable across different $q$ values. Therefore, we report IPN as a function of the cumulative number of physical measurements, denoted $B$, rather than the number of iterations. Under the snap-and-attach method, each batch contributes at most $q$ physical measurements, exactly $|\mathcal{U}_n|$, the number of unique, previously unmeasured codes after snapping, while still adding $q$ entries to the dataset by attaching each observed value to its originating continuous query. If a query snaps to a code that was measured earlier, we reuse its recorded measurement and do not count an additional measurement toward $B$.

Before applying batch BO, we conducted two initial measurements to initialize the surrogate model. These initial measurements were included in the total count. Across batch-BO settings with different batch sizes $q$, we used a fixed total physical-measurement budget of $B = 70$, including the two initial measurements.

3. Performance of Batch BO

Figs. 5(a), (b), and (c) show the IPN performance loss of batch BO for varying batch sizes $q$ on boards A, B, and C, respectively, measured relative to the per-board optimum IPN from the full trimming-code sweep combinations. The solid and the dotted lines represent the mean and the 95th percentile losses, respectively. Performance loss reflects the increase in IPN for a given method compared to the per-board optimum from the full sweep, i.e.,

(19)
$\text{Loss (dB)} = \text{IPN}_{\text{method}}\text{ (dBc)} - \text{IPN}_{\text{full-sweep}}\text{ (dBc)}.$

Fig. 5. Performance of the mean and 95th percentile losses with the batch size of q. (The solid and the dotted lines represent the mean and the 95th percentile losses, respectively.) (a) Board A. (b) Board B. (c) Board C.

../../Resources/ieie/JSTS.2026.26.5.327/fig5.png

In addition, a non-monotonic effect of $q$ on performance is observed. For small $B$, a moderate $q$ accelerated IPN reduction by testing multiple, diverse candidates early. As $B$ increases, smaller $q$ sizes became more effective due to frequent model updates that enhance surrogate adaptability. By contrast, a large $q$ (e.g., $q = 16$) performs poorly at large $N$ because many within-batch decisions are made without intermediate measurement feedback, yielding redundant or suboptimal measurements.

Selecting the batch size $q$ is practically important in queued single-instrument tuning because it governs the balance between diversification and update cadence under a fixed physical-measurement budget $B$. However, prescribing a universal optimal $q^*$ is nontrivial since the preferred tradeoff can be DUT-board dependent, reflecting board-to-board variations in the trimming landscape as well as measurement repeatability. Accordingly, rather than claiming a single $q^*$, we report results across a range of $q$ values under the same budget $B$ to identify a practical operating range. As a simple heuristic suggested by the trend in Fig. 5, we recommend avoiding overly large batches, in practice, a moderate $q$ is preferable in the early exploration regime, while smaller $q$ is more suitable in the refinement regime to preserve frequent surrogate updates.

Figs. 6(a), (b), (c) compare the IPN loss trajectories of fixed-$q$ batch BO and the $q$-switching batch-size schedule as a function of the number of distinct candidates on boards A, B, and C. The solid and dotted lines denote the mean and the 95th percentile losses, respectively. The $q$-switching schedule, denoted as batch BO ($q$ changes at $\tau$th physical measurement), starts with $q = 8$ and switches to $q = 2$ when the cumulative number of physical measurements reaches $\tau$. We evaluated at $\tau = 15, 20, 25$, and $30$. Table 1 summarizes the mean and 95th percentile losses at 70 distinct candidates. From this table, the $q$-switching schedule generally improved or maintained both the mean and the 95th percentile performances relative to fixed-$q$ baselines. In particular, switching from a larger $q$ early to a smaller $q$ later mitigated the 95th percentile degradation observed with a large fixed $q$, while achieving performance comparable to or better than a small fixed $q$.

Fig. 6. Performance of the mean and 95th percentile losses of fixed-q and q-switching schedule results on (a) Board A, (b) Board B, and (c) Board C. (The solid and the dotted lines represent the mean and the 95th percentile losses, respectively.)

../../Resources/ieie/JSTS.2026.26.5.327/fig6.png

Given the observed board-to-board variability, adaptive $q$ schedules may offer additional benefits beyond fixed-$q$ batch BO. While the simple $q$-switching schedule evaluated in this work provided consistent improvements or maintained performance across the tested boards, the optimal switching rule and schedule design are likely to depend on practical factors such as the measurement budget, noise level, and the local structure of the trimming response surface. A more systematic design of adaptive $q$ schedules and their empirical characterization across different boards and measurement conditions remains an important direction for future work.

Fig. 7 shows the elapsed time per proposed candidate (sec.) as a function of the number of generated candidates. For each board (A, B, and C), we repeated the experiment 1,000 times by generating 100 candidates per execution, regardless of whether quantization produced duplicate codes, and the results were aggregated across all three boards. The solid lines denote the mean per-candidate elapsed time and the shaded regions indicate the 5th–95th percentile range across executions. Batch BO selects $q$ candidates simultaneously in each iteration. As $q$ increases, acquisition-function optimization becomes more complex due to higher dimensional search space. In addition, the per-iteration computational overhead can increase because GP refitting and hyperparameter optimization are performed after every evaluation.

Table 1. Comparison of the IPN performance loss for fixed-q and q-switching schedule at the total number of physical measurements, B = 70.

Board

Method

Mean (dB)

95th Percentile (dB)

A

Fixed ($q = 2$)

0.30

0.65

Fixed ($q = 8$)

0.42

0.80

Switching ($\tau = 15$)

0.26

0.60

Switching ($\tau = 20$)

0.27

0.60

Switching ($\tau = 25$)

0.27

0.61

Switching ($\tau = 30$)

0.28

0.61

B

Fixed ($q = 2$)

0.41

2.09

Fixed ($q = 8$)

0.66

2.12

Switching ($\tau = 15$)

0.38

2.09

Switching ($\tau = 20$)

0.36

2.09

Switching ($\tau = 25$)

0.35

2.02

Switching ($\tau = 30$)

0.41

2.09

C

Fixed ($q = 2$)

0.26

0.71

Fixed ($q = 8$)

0.41

1.30

Switching ($\tau = 15$)

0.26

0.71

Switching ($\tau = 20$)

0.26

0.71

Switching ($\tau = 25$)

0.26

0.71

Switching ($\tau = 30$)

0.27

0.71

Fig. 7. Mean and 5th-95th percentile range of elapsed time per proposed candidate (sec.) with total number of generated candidates.

../../Resources/ieie/JSTS.2026.26.5.327/fig7.png

However, because batch BO generates $q$ candidates at once per iteration, the computation time per candidate decreases for the same total number of candidates. This trend is quantitatively confirmed by the execution-time measurements. Compared with sequential BO, the per-candidate computation time is reduced by a factor of approximately 1.33, 2.06, 3.46, and 6.64 for $q = 2, 4, 8$, and 16, respectively. These results indicate improved candidate-generation efficiency as $q$ increases. Moreover, the percentile range decreases with larger $q$, indicating that the computation time becomes more stable as $q$ increases.

4. Performance Comparison with Other Methods

In this section, we compared batch BO with sequential BO and genetic algorithm (GA). Both batch and sequential BO began with two initial configurations to initialize the surrogate model, followed by specific acquisition routines. For the GA, reflecting its population-based operation, we initialized it with 10 distinct configurations and, at each generation, produced 5 new candidate configurations [14], filtering out any duplicates from GA and BO.

Figs. 8(a), (b), and (c) depict the IPN performance loss for different batch sizes $q$ on boards A, B, and C, respectively. In addition, the solid and the dotted lines represent the mean and the 95th percentile losses, respectively. The batch BO consistently outperforms the GA across all three boards. For a small $B$, batch BO with $q = 8$ achieves a noticeably lower loss than sequential BO and GA. This indicates that batch BO can be effective when the measurement budget is limited.

Fig. 8. Performance of the mean and 95th percentile losses across different methods. (The solid and the dotted lines represent the mean and the 95th percentile losses, respectively.) (a) Board A. (b) Board B. (c) Board C.

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For larger $B$, the mean IPN loss shows minimal differences between batch and sequential BO. However, on boards A and C, batch BO achieves a considerably lower 95th percentile losses. Table 2 summarizes the IPN performance losses of batch BO, sequential BO, and GA at $B = 40$. For example, on board A, the 95th percentile loss is less than 2.0 dB for batch BO, approximately 4.0 dB for sequential BO, and approximately 7.5 dB for GA. This gap may reflect the ability of batch BO to select candidates jointly under the GP posterior, accounting for correlations and diversifying early evaluations across distinct promising regions. In turn, this reduces the susceptibility to unfortunate initializations and local optima. Our empirical evaluation used only three DUT boards, so the findings may not fully generalize to other PLL designs or broader process, voltage, and temperature variations. Validation on a larger and more diverse set of boards is left for future work.

Table 2. Comparison of the IPN performance loss at the total number of physical measurements, B = 40.

Board

Method

Mean (dB)

95th Percentile (dB)

A

GA

3.00

7.50

Sequential BO

0.88

4.09

Batch BO ($q = 2$)

0.67

1.95

Batch BO ($q = 8$)

0.64

1.29

B

GA

2.94

6.44

Sequential BO

1.10

2.50

Batch BO ($q = 2$)

1.12

2.31

Batch BO ($q = 8$)

1.20

2.45

C

GA

2.70

7.71

Sequential BO

0.83

3.53

Batch BO ($q = 2$)

0.69

2.03

Batch BO ($q = 8$)

0.94

2.44

5. Limitations and Future Work

Our measurements were conducted under nominal operating conditions, and a comprehensive sweep over process, supply-voltage, and temperature (PVT) variations was not performed due to the substantial additional effort required for hardware characterization. Future work will validate the observed batch-size behavior under PVT variations and across different PLL architectures, and will develop more systematic guidelines for selecting $q$ under such conditions.

In addition, given the observed board-to-board variability, systematically designing and validating adaptive $q$ schedules across different boards and measurement conditions remains an important direction for future work. Finally, we will investigate alternative acquisition functions and multi-objective formulations that consider figures of merit beyond IPN in RF-PLL design.

V. CONCLUSIONS

In this study, batch BO was investigated to minimize the IPN of the RF PLLs under discrete trimming codes and expensive measurements. We focused on a single instrument and a single DUT, where $q$ candidates were queued for sequential evaluation. Performance was compared based on the total number of physical measurements across three boards with sequential BO and GA.

The experiments revealed that a moderate batch size accelerated early IPN reduction and enhanced tail behavior at small measurement counts. At larger counts, the mean performance of batch BO was comparable to that of sequential BO, while the tail advantage persisted on certain boards. Notably, excessively large batch sizes yield poor results across the tested measurement counts, likely due to decisions made within batch without intermediate measurement feedback. These findings suggest that even without parallel instruments, an appropriately selected batch size can reduce the number of measurements required to achieve a target IPN, particularly under limited measurement budgets.

ACKNOWLEDGEMENTS

This work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. RS-2025-02216989 and No. RS-2023-00221494), the Regional Innovation System & Education (RISE) program through the Gangwon RISE Center, funded by the Ministry of Education (MOE) and the Gangwon State (G.S.), Republic of Korea (2025-RISE-10-002), and the Korea Institute of Planning and Evaluation for Technology in Food, Agriculture and Forestry (IPET) through the Smart Farm Innovation Technology Development Program funded by Ministry of Agriculture, Food and Rural Affairs (MAFRA) (grant number RS-2025-02221279). The R&S®FSPN Phase Noise Analyzer and VCO Tester was supported by the Semiconductor-Specialized University Program (P0028088), funded by the Ministry of Education and KIAT, Republic of Korea.

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Jonghoon Park
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Jonghoon Park was born in Seoul, South Korea, in 1999. He is currently pursuing a combined B.S. and M.S. degree at Kangwon National University, Chuncheon, South Korea. His research interests include mixed-signal integrated circuits and frequency synthesizer design.

Dongyong Choi
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Dongyong Choi was born in Paju, South Korea, in 2000. He is currently pursuing a B.S. degree in electrical and electronics at Kangwon National University, Chuncheon, South Korea. His research interests include machine learning and optimization.

Jungmin Kwon
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Jungmin Kwon received her B.S., M.S., and Ph.D. degrees from the Department of Electronic and Electrical Engineering, Ewha Womans University, Seoul, South Korea. She was a Postdoctoral Researcher with the Multiagent Communications and Networking Laboratory, Ewha Womans University, Seoul, South Korea, from 2024 to 2025. She is currently an Assistant Professor with the Department of Electrical and Electronics Engineering, Kangwon National University, Gangwon-do, South Korea. Her research interest lies at the intersection of network and distributed learning, in particular, in using network coding and federated learning approaches to facilitate data dissemination within dynamic and complex systems. Relevant applications can be wired/wireless networks and autonomous networks/systems with massive clients.

Kabseok Ko
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Kabseok Ko received his B.S. degree in mathematical science from Korea Advance Institute of Science and Technology (KAIST), Daejeon, South Korea, in 2007, and a Ph.D. degree at the School of Electrical Engineering from KAIST, Daejeon, South Korea, in 2017. From 2017 to 2021, he was a post-doctoral researcher in Chungnam National University, Daejeon, South Korea, and Qualcomm Institute, UCSD, La Jolla, CA. He is currently an Assistant Professor with Kangwon National University, Chuncheon, South Korea. His research interests include frequency regulation in power systems and demand response in power systems and optimization, 5G/6G cellular systems, and low-cost particulate matter sensors.

Kuduck Kwon
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Kuduck Kwon received his B.S. and Ph.D. degrees in electrical engineering and computer science from Korea Advanced Institute of Science and Technology (KAIST), in Daejeon, South Korea, in 2004 and 2009, respectively. His doctoral research concerned digital TV tuners and dedicated short-range communication (DSRC) systems. From 2009 to 2010, he was a Post-Doctoral Researcher with KAIST, where he studied a surface acoustic wave (SAW)-less receiver architectures and developed 5.8GHz RF transceivers for DSRC applications. From 2010 to 2014, he was a Senior Engineer with Samsung Electronics Co. LTD., Suwon, South Korea, where he has been involved with studies of the SAW-less software-defined receivers and development of CMOS transceivers for 2G/3G/4G cellular applications and receivers for universal silicon tuners. In 2014, he joined the Department of Electronics Engineering, Kangwon National University, Chuncheon, South Korea, where he is currently a Professor. His research interests include CMOS mmWave/RF/analog integrated circuits and RF system design for wireless communications.

In-Chul Hwang
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In-Chul Hwang received his B.S., M.S., and Ph.D. degrees from Korea University, Seoul, South Korea, in 1993, 1995, and 2000, respectively. He was a Postdoctoral Associate with the Coordinated Science Laboratory, University of Illnois at Urbana–Champaign, Urbana, IL, USA, from 2000 to 2001. In 2001, he joined Samsung Electronics, System LSI Division, Giheung-gu, South Korea. Since 2007, he has been with the Department of Electrical and Electronics Engineering, Kangwon National University, Chuncheon, South Korea, where he is currently a Professor. He was a Visiting Scholar with the Georgia Institute of Technology, Atlanta, GA, USA, in 2012 and he is a vice president of IEIE since 2023. His current research interests include digital PLL for RFIC and digital LDO for dynamic-voltage and frequency scaling applications.

Seungyoung Park
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Seungyoung Park received his B.S., M.S., and Ph.D. degrees in electrical engineering from Korea University, Seoul, South Korea, in 1997, 1999, and 2002, respectively. From September 2002 to March 2003, he was with Korea University, Seoul, South Korea, where he was a Post Doctoral Research Associate. From April 2003 to December 2005, he was with Samsung Advanced Institute of Technology, Kiheung, South Korea, where he was a Senior Engineer, working on several projects in the field of next-generation wireless mobile communications. From January 2006 to February 2007, he was with the Department of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, where he was a Postdoctoral Research Associate. Since March 2007, he has been with the Department of Electrical and Electronics Engineering, Kangwon National University, Chuncheon, South Korea, where he is currently a Professor. From January 2012 to February 2013, he was with the Department of Electrical and Computer Engineering, Purdue University, West Lafayette, IN, where he was a Visiting Scholar, supported by the LG Yonam Foundation. As of March 2023, he took on the role of research advisor at an autonomous vehicle security technology company AUTOCRYPT, Co., Ltd., Seoul, South Korea. His research interests include machine learning applications in wireless communications, agriculture, and cyber security.